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frontend/listing/product-box/box-basic.tpl
Delay Fault Testing for VLSI Circuits
  • Kartoniert
  • 208 Seiten
  • Erschienen 2012
  • -
inkl. MwSt. versandkostenfrei Lieferzeit 1-3 Werktag(e)
Delay Fault Testing for VLSI Circuits
In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. With improvements in the semiconductor...
ab 128,39 €
frontend/listing/product-box/box-basic.tpl
Delay Fault Testing for VLSI Circuits
  • Gebunden
  • 212 Seiten
  • Erschienen 1998
  • -
inkl. MwSt. versandkostenfrei Lieferzeit 1-3 Werktag(e)
Delay Fault Testing for VLSI Circuits
In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. With improvements in the semiconductor...
171,19 €
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