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Applied Scanning Probe Methods VII
  • Gebunden
  • 380 Seiten
  • Erschienen 2006
  • Springer-Verlag GmbH
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Applied Scanning Probe Methods VII
The first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing so fast that there is a need for one volume every 12 to 18 months to capture latest developments....
160,49 €
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Applied Scanning Probe Methods XI
  • Gebunden
  • 236 Seiten
  • Erschienen 2008
  • Springer-Verlag GmbH
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Applied Scanning Probe Methods XI
"The ability to accurately and reproducibly measure the properties and perf- mance characteristics of nanoscale materials, devices, and systems is a critical enabler for progress in fundamental nanoscience, in the design of new nanoma-...
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Applied Scanning Probe Methods XIII
  • Gebunden
  • 238 Seiten
  • Erschienen 2008
  • Springer-Verlag GmbH
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Applied Scanning Probe Methods XIII
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to...
160,49 €
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Applied Scanning Probe Methods XII
  • Gebunden
  • 224 Seiten
  • Erschienen 2008
  • Springer-Verlag GmbH
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Applied Scanning Probe Methods XII
Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role...
160,49 €