Produktinformationen "Computational Surface and Roundness Metrology"
"Computational Surface and Roundness Metrology" provides an extraordinarily practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysis. The book, in combination with a mathematical package or programming language interface, provides an invaluable tool for experimenting, learning, and discovering the many flavors of mathematics that are so routinely taken for granted in metrology. Whether the objective is to understand the origin of that ubiquitous transmission characteristics curve of a filter we see so often yet do not quite comprehend, or to delve into the intricate depths of a deceptively simple problem of fitting a line or a plane to a set of points, this book describes it all (in exhaustive detail). From the graduate student of metrology to the practicing engineer on the shop floor, this book is a must-have reference for all involved in metrology, instrumentation/optics, manufacturing, and electronics. von Muralikrishnan, Bala
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Bala Muralikrishnan has a PhD in Mechanical Engineering from the University of North Carolina at Charlotte, USA. He works for the National Institute of Standards and Technology, where he is a guest researcher in the Engineering Metrology Group of the Precision Engineering Division - one of the divisions of the Manufacturing Engineering Laboratory. Jayaraman Raja has a PhD in Mechanical Engineering from the Indian Institute of Technology, Madras, India. He is a professor and chairman in the Department of Mechanical Engineering & Engineering Science at the University of North Carolina at Charlotte, USA. His research interests include Surface & Form Metrology; Computational Metrology; and Precision Engineering.