Next Generation and Advanced Network Reliability Analysis

Über den Autor

Syed R. Ali, DEE, is currently CEO and Principal of Software Reliability Research, LLC conducting upfront research and consultation with sophisticated software tools and methodologies for companies and organizations that seek state-of-the-art reliability analysis of their products and services for Next Generation Networks (NGN), Virtualized Networks, emerging wireless and other technologies. The objective of his organization is to provide high reliability framework for assessing and measuring overall operational end-to-end reliability of complex real-time mission critical systems. Syed was principal consultant at Bell Communications Research for over 30 years and was instrumental in setting up industry wide metrics was measuring software quality at all life cycle phases. He pioneered the concept of software fault insertion techniques for increasing software reliability before its released. While at Telcordia (formerly Bellcore) he developed Telcordia's In-Process Quality Metrics (IPQM, GR-1315), Object Oriented Process Metrics (OOPM, SR-4047), and contributed to many IEEE and ISO standards. He is author of book "Digital Switching Systems -System Reliability Analysis published by McGraw-Hill, 1997, ISBN 0-07-001069-2. Syed is an expert in the field with extensive experience in analyzing reliability of advanced network architectures around the world. He has consulted with Ericcson (Sweden), Nortel (Canada), Siemens (Germany), NEC (Japan), Alcatel, (France), Singtel (Singapore), and Fujitsu (Japan) and has supported many international standard bodies. Syed is the past chairperson of IEEE Communications and co-founder of Computer Society New York Section. He is a frequent speaker at many IEEE and international telecommunications forums and is regarded as a leader in the field of reliability. Syed received his BSEE from Bangladesh University of Engineering & Technology (BUET), MSEE from Tuskegee University, Tuskegee Alabama and DEE from New Jersey Institute of Technology, Newark, NJ.