Publisher's Note: Products purchased from Third Party sellers are not guaranteed by the publisher for quality, authenticity, or access to any online entitlements included with the product. PROVEN TECHNIQUES FOR GENERATING HIGH-FIDELITY MEASUREMENTSPower Integrity: Measuring, Optimizing, and Troubleshooting Power Related Parameters in Electronics Systems provides field-tested techniques for producing high-fidelity measurements using the appropriate equipment. The book thoroughly discusses measurement guidelines, test instrument selection and use, connecting the equipment to the device being tested, and interpreting the acquired data. The latest electronics technologies and their impact on measurement are discussed. Detailed photographs, screenshots, schematics, and equations are included throughout this practical guide.Learn how to accurately measure:ImpedanceStabilityPower supply rejection ratio (PSRR)Reverse transfer and crosstalkStep load responseRipple and noiseEdgesHigh-frequency impedance von Sandler, Steven M.
Steven M. Sandler (Mesa, AZ) is currently a consultant to AEi Systems LLC, a power electronics firm he founded in 1995. He has developed and taught courses at Motorola University and has published many articles on power circuit modeling for PCIM, PEIN, and Intusoft Online. He holds a BSEE from Pacific Western University, and is the author of Spice3 SMPS Simulation.